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Planarization Motherboards |
Spring Probe Towers and
Mechanical Docking |
The Integrated Test approach to test interface design is driven by test floor requirements - the most electro-mechanically robust solution at the most economical price.
We achieve these goals by using design for manufacturability practices with our PCB and mechanical designs to ensure components can be fabricated for the lowest possible costs.
We also minimize the number and complexity of parts to ensure that our designs are rugged enough to withstand years of use with little or no maintenance. |
