Integrated Test has products for the entire signal path between your test system pin electronics and your preferred probe head or socket that makes contact with the device under test. We are uniquely capable of designing and manufacturing this entire signal path to ensure you get the most consistent signal path at the best possible price.

Our current product set consists of printed circuit board fabrication, probe interface board design and fabrication, spring probe towers, cabled interfaces, probe interface hardware, probe card planarization motherboards and mechanical docking hardware.